Chapter 7p207 239 PDF
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Foothill-De Anza Community College District
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This document discusses the process of silicon wafer oxidation, specifically focusing on the illustration and related concepts. It appears to be part of a larger section on semiconductor fabrication and may be academic material.
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FIGURE 7.33 FIGURE Illustration 7.32...
FIGURE 7.33 FIGURE Illustration 7.32 206 loaded Silicon istry inthe the A building top dry thickness we wafers of can oxidation surface being thermal a se real I that of need oxidation transistor. the process into silicon Original silicon oxiquideckly, an process. SiO2 Silicon 55% surface is is is oxidation actually illustrated again and Earth: then furnace. in consumed pristine. at 45% the Introduction (Courtesy Figures end in7.32 This of wafer Si surface silicon Post-oxidation the switch is to Texas and Microelectronics a ments, production 7.33.common back from Just ensure too fabrication dry of Nanotechnology and Inc., oxide, oxidation Dallas, basic chemthe and path TX.) to thus taken we 7.34 DOn FHGURE cGraw-Hill, Oevices, Although them orthosilicate Yep, exhaust) for attrying Guch land in efypically chem-speak rosilane isexample, As an eLPCVD oxitstarted; engage hundred hicdke above.Akealy Bricks any sr down we wafers of given to systems the and an loading door Wafers these produce creative eh you (known 900°C aboutdeposit. (low-pressure accomplished thick eat IMortar: M LPCVD Temperature easily into nanometers). layers original ProcesS inletgas desired are get up New oxides appropriate system. hydrochloric means one to the Presto! aoften chemistry oxides, (say it: |our and as furnace silicon York, Micro/Nanoelectronics 100precious are Si(OC,H,), TEOS surprisingly, film,there (not run more - 2005.) (lnspired quickly, SiCl,H, generally CVD) with at to or surface,55). each that even than on reduced"deposit" Read: crystal by the acid depOsitfa(ibn gases cantools. the with other Anderson, ’ street, 2N,O’ + with ubiquitous be few a and Center zOne inferior SiO, as (chemical LPCVD (below Not zoneflat Heating coils excellent their controllably materials layers always thmake e to + for a Fabrication B.L. by-product! 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(710) Of " for as a oe rates" Siliconterned on doestective matter is attacks on I FIGURE 7.35 An Rricks cause rrowMserul ctangular-shaped ASused an SiO0>nhce, Crystalnyaroxide Ir said wouldn' oO used top t Asautomated y Same 1lustrated Per, E Oxide one Oxidesee an important Why creating in triVially of instead Tshape notlayer to everywhere how intoOxide and wet but"etch MEMS/NEMS etchdirectionsat approximately as etch have example, in wet Such a (KOH). advise wet-etching Mortar: deep all directions 45° an long vat abut etching profiles," versus inetching a etch stop wanted onto the inon good directions), angle etch "trenches" as Figureself-limiting BHF top of does it dipping a the deep on stop KOH except the at"Photolithography" of stays BHE, "etch very Micro/Nanoelectronics tends from technology. dry pattern, the different to to surface (an the not tool. shapes 7.3techniques 6, V-shaped (don' the t 2has etch the common etching? surface um/min. in where organic selectivity' oxide the " inattack your (Courtesy toisotropic intwhereas o this good I other) silicon of oxide undercut to wet deep canpanic--simply etch fingers the case. Ithe in bath silicon. of be etching dry Well, formactually putphotoresist a will etchant various to etch groves ofacan rates.selectivity (amazingly, Intel etched silicon An (or wafer particular the to into the "anisotropic" etching Interestingly, be polysilicon), oxide section), Corporation, it th(quite e protective silicon etchHence, Fabrication ch get typicallyrelates etmaterials. control intowafer highas For (meaning: until it! for can basisclever the example, two would BHF t ifI oxide layer both to then shape mask, finer as (doesn'called it behas to the anddifferentunderneath is Santa and (etcheseasily so-called the ofand silicon KOH oxide for etch BHF can I be reacheslower an is Anisotropic "blowing arn etch simply400:l; the instance, (this etch an buffered a especially my Clara, finer "isotropic" resultant useful).depth surtace. mask-instant use good in tailored meaning directions differential also and etches BHF called isit)"etch. thwafer e CA.) only "bulk As expose attacks nitride, a example stop"). Ifsiliconhydrofluoric up" and independent If polysilicon t he I nic e etching more "etch we might I to further an with or one to etch instead Ithe ifl in oxide "transfer" and etchant createanumber micromachining" direction) profile" will open etching different with pattern "etch of In oxide ballooningclosely becomes profile wafer the use an pattern this then see use crystal a silicon layer down mask") acid of potassium transfer). that etch deposited case, because desired. inthe pattern a to ratio stop, packed, to (etches awiderKOH, siliconcould to mask a (BHF). out" espe etch later etch "etch the pat that pro BHF 209 inlat for no of it FIGURE 210 lonoth) we Aurora, The skies. TheGEEK tant thescale, stripping gas chemistry. is many shapes to The 7.36 emissionabove field the type skies, instead essentially Dry one sidewall (magnetosphere), solar are aurora aurora plasma nice(literally or 80 typically At the transistors etchingarnother. during northernthe TRIVIA: froma km), caused wi nd have borealis featuresaurora the Got etch sunrise-like Roman borealis can an from gas a a valence is etching, profiles creating orbythe be borealis of gas it? per This latitudes,AURORA Yep! etDrcyh etch WetTypeetchof Oxygen coronal the September goddess is very plasmas of performed that for aurora often is the ions). fundamentally IC dark-red glowing with collision electrorns Plasma--fourth (see there hence both plasma, storms I origin chemically has Silicon gas australis, called ofthis Plasma wet- phenomenon theBOREALIS of isthe had witha canlimiting Anisotropic (tapered) glow plasmas. atoms of to that and Sidewall profile resulting and October thdawn, e the "Geek from Silicon trench Earth: resu energetic Anisotropic Isotropic Isotropic then australis reactive--read: if inenergy reactive be dry-etching lat found "northern haunting weaction? the determines (read: 630 Light and Trivia: state how profile EtchIntroduction in in are and choose applied nm).either charged meaning Boreas, is gas "plasma." a subsequently emitted the glowing Well, of big close processes. Marchlights" known Aurora molecules, matter For Earth's the to deal). the ghostly a particles think two to some during "ofbecauseto the lights as a right it size upper theApril. Greek the greatBorealis" (solid, in Oh shapes cool of Visual Microelectronics greenish an (eg.. trapped South" sometimes aurora starting etchant. fluorescent andsome yeah?! Innameit liquid, the picsatmosphere aurora the is sidebar). thus form to electrons) thein invisibleborealis, Thinktransistor be see southern for gas glow is Latin. seen creating gas, light. Figure only the to In (typically back etched and | (at often Earth's plasma). (often Auroras that north ionize, and 558 polar innamed polar in our or, to can Nanotechnology ll:Odominated come on an nmmagnetic at regioi northe wind case, electrical), high hence the "ionized" A be o lo wave- altitudes fro " grander a plasmaschool resu One placed by o how FIGURE 7.38 also we Illustration ions atinto Semiconductor Devices, FIGURE7.37 Mortar: Deicks and Nlustration or directional etch etchwhisked RIE do 13.56 In profiles. apply then the a for typical MHz not chamber, of of short away want the Exposed abombard a atom Such (no plasma-etching sma-etching DC and plasma-etching control (Figure electric to Process chamber etch. real and McGraw-Hill, Micro/Nanoelectronics Fabrication plasma-etching a sucked the magic is Process gases 7.39). in Exhaust gases field surface, The then process. PR the out system. Typical ions on system New plasma to of ionized the (1nspired York, bond the thesuitably cooling helium Lncident Etchant ions ions plasma number; Backside system RIE process, chamber (Figure by 2005.) with etch protected use by Plasma is that the it 737), Anderson, Etching gasesallowing often as is of