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Questions and Answers
What is the purpose of the Siemens technique in silicon purification?
What is the purpose of the Siemens technique in silicon purification?
What is the typical thickness of the native oxide layer formed on a silicon wafer?
What is the typical thickness of the native oxide layer formed on a silicon wafer?
What is the primary purpose of a cleanroom in semiconductor fabrication?
What is the primary purpose of a cleanroom in semiconductor fabrication?
What are the primary steps involved in the RCA cleaning process for silicon wafers?
What are the primary steps involved in the RCA cleaning process for silicon wafers?
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What is the main purpose of gettering in semiconductor fabrication?
What is the main purpose of gettering in semiconductor fabrication?
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Why are HEPA filters used in cleanrooms?
Why are HEPA filters used in cleanrooms?
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Which of the following is NOT a key factor in the design and operation of a cleanroom?
Which of the following is NOT a key factor in the design and operation of a cleanroom?
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What is the significance of the Czochralski (Cz) and Kyropoulos (Ky) crystal growth techniques?
What is the significance of the Czochralski (Cz) and Kyropoulos (Ky) crystal growth techniques?
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What is the primary difference between the Czochralski (Cz) and Kyropoulos (Ky) crystal growth techniques?
What is the primary difference between the Czochralski (Cz) and Kyropoulos (Ky) crystal growth techniques?
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Which of the following is NOT a type of gettering used in semiconductor fabrication?
Which of the following is NOT a type of gettering used in semiconductor fabrication?
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Flashcards
Siemens Technique
Siemens Technique
A technique used in silicon purification to remove impurities by converting silicon into volatile chlorosilanes. High-purity silicon is then deposited onto heated filaments.
Czochralski Crystal Growth
Czochralski Crystal Growth
The process of growing a single crystal of silicon from a molten silicon pool. A seed crystal is dipped into the melt and slowly pulled out.
Vacancy
Vacancy
A point defect in a crystalline lattice where an atom is missing from its normal position.
Interstitial Atom
Interstitial Atom
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Controlling Contaminants in Silicon Wafer Fabrication
Controlling Contaminants in Silicon Wafer Fabrication
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Clean Rooms
Clean Rooms
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RCA Cleaning
RCA Cleaning
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Gettering
Gettering
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Polysilicon Backside Gettering
Polysilicon Backside Gettering
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Metal Gettering
Metal Gettering
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Study Notes
Semiconductor Fabrication
- Semiconductor materials: Silicon (Si) is the primary material used for integrated circuits (ICs). It has a diamond crystal structure.
- Crystal structure: Crystals are characterized by repeating unit cells in x, y, and z directions. Planes and directions are defined using an x, y, z coordinate system with Miller indices.
- Silicon purification: Silicon is purified from silicon dioxide (SiO2) using methods like high-temperature melting and chlorosilanes. The goal is to achieve extremely high purity (e.g., 99.9999%).
- Czochralsky (CZ) method: A common method for producing single-crystal silicon. Raw materials are melted, and a single-crystal seed is introduced to initiate crystal growth.
- Control parameters in CZ: Pull rate, temperature, and rotation rate are key control parameters.
- Float zone (FZ) method: An alternative technique for refining and growing single-crystal silicon.
- Wafers: Silicon crystals are sliced into thin wafers for IC manufacture. The wafers must be polished to achieve high surface quality.
- Impurities: Oxygen (O) and carbon (C) are common impurities in silicon. O and C in CZ silicon typically reach concentrations on the order of 1018 cm-3 and 1016 cm-3, respectively.
- Defects: High-temperature processing and other manufacturing steps can introduce defects (e.g., point defects, dislocations) into crystals. These can affect device performance.
Clean Rooms and Wafer Cleaning
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Clean rooms: Critical environments to minimize particle contamination during IC fabrication and processing.
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Cleaning protocols: Wafer cleaning procedures utilizing chemicals like those in RCA cleans ("standard process"). Removal of organics, heavy metals and alkali ions are crucial.
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Methods for removing contamination: Cleaning techniques include using ultrasonic agitation combined with appropriate chemicals.
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RCA clean: A typical "standard process" for removing contaminants from silicon wafers. This process uses different mixtures of chemicals (e.g., hydrogen peroxide, sulfuric acid, nitric acid, ammonium hydroxide) to clean off organic, metal, and other components on the surface.
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Gettering: A process designed to remove unwanted metal ions and alkali ions from device active regions.
- Intrinsic gettering: Employing Si wafers, precipitation of SiO2, through temperature cycles.
- Extrinsic gettering: Utilising dielectric layers and metal traps on backside of wafer.
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Contaminants: Particles, organic films (e.g., photoresist), and heavy metals are contaminants that can affect device performance.
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Important control parameters: Air quality, temperature, and humidity are strictly controlled parameters during wafer processing within clean rooms.
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Description
Explore the fundamental concepts of semiconductor fabrication, including the properties of silicon, crystal structures, and purification methods. Learn about the Czochralsky and Float Zone methods, essential for producing single-crystal silicon. This quiz will test your knowledge on the key techniques and parameters involved in the semiconductor manufacturing process.