10 Questions
What principle is the Atomic Force Microscope (AFM) based on?
Cantilever principle
What is the diameter of the sharp tip used in AFM?
10–20 nm
How is the three-dimensional topographical map of the surface generated in AFM imaging?
By plotting the local sample height as a function of the horizontal tip location
What enables the piezoelectric scanners in AFM to maintain the tip at a constant force or constant height above the sample surface?
Feedback mechanisms
How does resolution in AFM imaging differ from radiation-based microscopy techniques?
Resolution in AFM imaging is not related to radiation-based microscopy techniques
What is the most common method used to track deflection in scanning probe microscopes?
Optical lever or beam-bounce detection
What is the purpose of coating the cantilever's back with gold or another metal in an AFM?
To improve its ability to reflect the laser beam
What material is typically used to create the probe in scanning probe microscopes?
Diamond or silicon
What are some major components of an AFM?
Scanning probe, cantilever, scanning stage, detection system
Which type of technique is NOT mentioned for detecting the forces exerted by the sample on the probe?
Magnetic resonance imaging
Learn about the atomic force microscope (AFM) and its cantilever principle, which involves a small hook connected to one end of the cantilever to measure the force exerted by the tip on the sample. Understand the scanning process using a sharp tip and feedback mechanisms in AFM.
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