10 Questions
What is the principle behind AFM?
Cantilever principle
What is the typical diameter of the sharp tip used in AFM?
1-5 nm
How is a three-dimensional topographical map generated in AFM?
By plotting local sample height as a function of horizontal tip location
What differentiates resolution in AFM imaging from radiation-based microscopy techniques?
AFM imaging has different principles of height measurement
How does AFM differ in terms of sample movement compared to other microscopy techniques?
The sample is moved underneath the cantilever
What is the most common method used to track deflection in scanning probe microscopes?
Optical lever or beam-bounce detection
How does coating the cantilever's back with gold or another metal improve its ability to reflect the laser beam?
It allows more of the laser beam to reach the detectors
What is the purpose of the scanning stage in an AFM setup?
To provide a stable base for the sample
What is the composition of the scanning probe typically used in AFM?
Diamond or silicon
Which detection technique is NOT mentioned as part of the detection system in AFM?
Magnetic detection
Learn about the principles of Atomic Force Microscope (AFM) which is based on the cantilever principle and uses a sharp tip to scan surfaces with feedback mechanisms. Understand how the force exerted by the tip on the sample is measured by following the cantilever’s deflection.
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