Scanning Electron Microscope (SEM) is used for studying surfaces of objects.
An electron beam is generated by heating a metallic filament and focused by electromagnetic lenses.
The electron beam is rastered across the sample and secondary electrons are emitted from the surface of the specimen.
Detectors collect these secondary (or backscattered) electrons and convert them into a signal to build up an image.
Sample preparation for SEM requires conductive coating.
Electrically conductive samples are required for SEM imaging.
Gold atoms are the most widely used for SEM sample preparation.
SEM images are created by mapping detected signals with beam position.
SEM images are similar to TV images.
SEM is a powerful tool for studying surface morphology and microstructure.

Test your knowledge on the Scanning Electron Microscope (SEM) with this quiz! Learn about the components of an SEM, how it works, and the importance of sample preparation. Explore the capabilities and benefits of SEM imaging, including its ability to study surface morphology and microstructure. Challenge yourself with questions on SEM image creation, sample requirements, and more. Keywords: Scanning Electron Microscope, SEM imaging, surface morphology, microstructure, sample preparation, detectors, secondary electrons.