Podcast
Questions and Answers
Which testing method is known for temperature cycling and vibration to identify latent defects?
Which testing method is known for temperature cycling and vibration to identify latent defects?
- Built-In Self-Test (BIST)
- Radio Frequency (RF) Testing
- Environmental Stress Screening (ESS) (correct)
- Boundary Scan Testing
Which testing method does not require physical access to all internal nodes of an IC?
Which testing method does not require physical access to all internal nodes of an IC?
- Environmental Stress Screening (ESS)
- Boundary Scan Testing (correct)
- Built-In Self-Test (BIST)
- Radio Frequency (RF) Testing
Which testing method reduces testing time and cost by incorporating test circuitry within the IC?
Which testing method reduces testing time and cost by incorporating test circuitry within the IC?
- Built-In Self-Test (BIST) (correct)
- Environmental Stress Screening (ESS)
- Boundary Scan Testing
- Radio Frequency (RF) Testing
Which testing method focuses on verifying the performance of analog and mixed-signal ICs?
Which testing method focuses on verifying the performance of analog and mixed-signal ICs?
Which testing method specifically verifies parameters such as frequency, power, modulation, and noise characteristics of ICs designed for wireless communication applications?
Which testing method specifically verifies parameters such as frequency, power, modulation, and noise characteristics of ICs designed for wireless communication applications?
What is the primary goal of wafer sort testing?
What is the primary goal of wafer sort testing?
What type of testing verifies that the IC performs its intended function correctly according to the specifications provided by the manufacturer?
What type of testing verifies that the IC performs its intended function correctly according to the specifications provided by the manufacturer?
What type of testing measures various electrical parameters of the IC such as voltage, current, frequency, and timing?
What type of testing measures various electrical parameters of the IC such as voltage, current, frequency, and timing?
What type of testing evaluates the long-term performance and durability of the IC under different environmental conditions?
What type of testing evaluates the long-term performance and durability of the IC under different environmental conditions?
What is the purpose of subjecting the IC to prolonged operation under elevated temperature and voltage conditions?
What is the purpose of subjecting the IC to prolonged operation under elevated temperature and voltage conditions?
What is the primary purpose of Environmental Stress Screening (ESS)?
What is the primary purpose of Environmental Stress Screening (ESS)?
What does Boundary Scan enable?
What does Boundary Scan enable?
What is BIST an abbreviation for?
What is BIST an abbreviation for?
What type of ICs is RF testing specifically designed for?
What type of ICs is RF testing specifically designed for?
What standard defines the architecture for JTAG testing?
What standard defines the architecture for JTAG testing?
At which level is wafer sort testing conducted?
At which level is wafer sort testing conducted?
What is the primary goal of final testing?
What is the primary goal of final testing?
What does parametric testing measure?
What does parametric testing measure?
What is the purpose of burn-in testing?
What is the purpose of burn-in testing?
What type of testing involves applying input signals and observing output responses?
What type of testing involves applying input signals and observing output responses?
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