Spinel Structure and Fe3O4 Applications
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Questions and Answers

What primarily contributes to surface topographic contrast in SEM?

  • Backscattered electrons (BSEs)
  • X-rays generated from specimens
  • Primary beam electrons
  • Secondary electrons (SEs) (correct)
  • Which electrical issue is commonly associated with examining nonconductive surfaces in SEM?

  • Inadequate electron beam focus
  • Surface charging (correct)
  • Low energy electron interactions
  • High-voltage discharge
  • What is the effect of using higher electron beam energy in SEM?

  • It reduces the amount of secondary electrons observed.
  • It enhances surface detail resolution.
  • It provides information about the bulk material. (correct)
  • It increases the surface charging effect.
  • What causes compositional contrast in SEM images?

    <p>Atomic number of specimen atoms</p> Signup and view all the answers

    How can surface charging in SEM be effectively reduced?

    <p>By coating the specimen with a conductive film</p> Signup and view all the answers

    What is the correct formula representation for normal spinel?

    <p>(A)8a[B^2]16dO4</p> Signup and view all the answers

    What is the Crystal Field Stabilization Energy (CFSE) of Fe2+ in the octahedral site?

    <p>-4</p> Signup and view all the answers

    Which of the following statements about Fe3+ cations is true?

    <p>Fe3+ has equal stabilization in both octahedral and tetrahedral sites.</p> Signup and view all the answers

    How does particle size affect the line broadening observed in XRD analysis?

    <p>Line broadening increases with decreasing particle size.</p> Signup and view all the answers

    What is the purpose of small angle X-ray scattering (SAXS) in XRD applications?

    <p>To determine particle inhomogeneities of the order of 1 – 100 nm.</p> Signup and view all the answers

    What is the significance of the diffraction angle (2θ) in a Transmission Electron Microscope (TEM)?

    <p>It must be very small (≤1°) for diffraction patterns to occur.</p> Signup and view all the answers

    Which beam combination is essential for generating phase contrast in TEM?

    <p>The transmitted beam and the diffracted beam.</p> Signup and view all the answers

    What outcome results from the recombination of transmitted and diffracted beams in TEM?

    <p>An interference pattern with periodic dark-bright changes.</p> Signup and view all the answers

    How does the diffraction pattern form on the back-focal plane when the transmitted beam is parallel to a crystallographic axis?

    <p>All diffraction points from the same crystal zone form a pattern.</p> Signup and view all the answers

    Why is phase contrast often referred to as high-resolution transmission electron microscopy (HRTEM)?

    <p>It delivers the highest resolution of lattice and structure images for crystalline materials.</p> Signup and view all the answers

    What structure does MnO possess?

    <p>Sodium chloride structure</p> Signup and view all the answers

    At what temperature does the magnetic ordering of Mn2+ ions in MnO break down?

    <p>293 K</p> Signup and view all the answers

    What is the effective magnification of an SEM with a probe size of 10 nm?

    <p>20,000×</p> Signup and view all the answers

    What additional information can SEM obtain using an X-ray energy-dispersive spectrometer (EDS)?

    <p>Chemical composition</p> Signup and view all the answers

    What type of electrons are produced through elastic scattering in SEM?

    <p>Backscattered electrons</p> Signup and view all the answers

    What percentage of energy do backscattered electrons typically retain from incident electrons?

    <p>60-80%</p> Signup and view all the answers

    What is one of the advantages of scanning electron microscopy (SEM) in terms of image depth of field?

    <p>Provides a three-dimensional appearance</p> Signup and view all the answers

    How is the magnification of SEM determined compared to transmission electron microscopy (TEM)?

    <p>By the ratio of screen size to specimen size</p> Signup and view all the answers

    Which equation relates the full width at half maximum (β) to the crystallite size (τ) and the diffraction angle (θ)?

    <p>β = λ / τ cos θ</p> Signup and view all the answers

    What is represented by the variable 'k' in the relation β = k ε (sin θ / cos θ)?

    <p>The constant related to microstrain</p> Signup and view all the answers

    How can the combined effects of crystallite size and microstrain on β be separated?

    <p>By plotting β cos θ versus sin θ</p> Signup and view all the answers

    What does the differentiation of the equation nλ = 2d sin θ provide insight into?

    <p>The change in lattice spacing with microstrain</p> Signup and view all the answers

    What does the term β cos θ relate to in the context of XRD?

    <p>Crystallite size</p> Signup and view all the answers

    Which application involves assessing changes in the lattice parameter with temperature?

    <p>Determination of thermal expansion coefficient</p> Signup and view all the answers

    What type of information can be determined about crystal structures using XRD with single crystals?

    <p>Unknown structures and various structural details</p> Signup and view all the answers

    Which factor influences line broadening due to nonuniformity in the sample?

    <p>Crystallite size and microstrain</p> Signup and view all the answers

    Study Notes

    Spinel Structure

    • Eight MgAl2O4 formulas per unit cell
    • Oxygen forms a face-centered cubic (fcc) lattice.
    • Half of the octahedral sites are occupied by B ions in an alternating pattern.
    • One-eighth of the tetrahedral sites are occupied by A ions.
    • Normal spinel: (A)8a[B2]16dO4
    • Inverse spinel: (B)8a[AB]16dO4

    Fe3O4 Spinel

    • Fe2+ (high spin): 3d6, t2g4eg2 (octahedral), e3t23 (tetrahedral)
    • Octahedral site stabilization energy (OSSE) for Fe2+ is -1.33 Dqoct, making it more stable in octahedral sites than tetrahedral sites.
    • Fe3+ (high spin): 3d5, t2g3eg2 (octahedral), e2t23 (tetrahedral)
    • Fe3+ has no preference for octahedral or tetrahedral sites.
    • Cation distribution in Fe3O4: (Fe3+)tet[Fe2+Fe3+]octO4, or (Fe3+)8a[Fe2+Fe3+]16dO4 (inverse)
    • Magnetic measurements confirm the cation distribution.

    Applications of X-ray Diffraction (XRD)

    • Particle size analysis using XRD is effective for particles smaller than 200 nm.
    • Line broadening increases as particle size decreases.
    • Below 2-10 nm, lines become so broad that they disappear.
    • Small-angle X-ray scattering (SAXS) measures inhomogeneities from 1-100 nm.
    • Line broadening is influenced by instrumental factors (resolution of incident X-ray wavelength) and sample factors (crystallite size & microstrain).

    Microstrain Determination

    • Scherrer equation:  =  /  cos 
    • Microstrain is related to line broadening through the equation: = - ( / 2) (cos / sin )
    • Combined effect of crystallite size and microstrain:  cos  = k sin 
    • Plotting  cos  vs.sin  separates crystallite size and strain effects.

    Other Applications of XRD

    • Determining thermal expansion coefficient through changes in lattice parameter with temperature.
    • Assessing phase transitions at different temperatures.
    • Determining crystal structure with single crystals, including atom positions, space groups, bond lengths, coordination numbers, and electron distribution.

    Neutron Diffraction of MnO

    • Neutrons have a magnetic dipole, leading to magnetic scattering.
    • MnO adopts a sodium chloride structure with a Neel temperature of 120 K.
    • At 80 K, Mn2+ ions undergo antiferromagnetic ordering, doubling the unit cell for neutron scattering but not for X-ray scattering.
    • Magnetic ordering breaks down at 293 K due to thermal energy.

    Scanning Electron Microscopy (SEM)

    • Examines microscopic structure by scanning the surface.
    • Offers high resolution and depth of field, providing a three-dimensional view.
    • Magnification is determined by the ratio of display screen size to specimen area scanned.
    • Provides magnifications from 20× to > 100,000×.
    • Chemical information is obtained using an X-ray energy-dispersive spectrometer (EDS).

    Signal Detection in SEM

    • Elastic scattering produces backscattered electrons (BSEs) which are useful for elemental composition contrast.
    • Inelastic scattering produces secondary electrons (SEs) which are used to create topographic contrast images.
    • By varying the energy from 5 to 20 keV, surface features (low keV) or bulk information (high keV) can be obtained.

    Topographic Contrast in SEM

    • Variation in signal levels due to geometric features on the specimen surface.
    • Edges emit more electrons than flat surfaces.

    Particle Shape and Elemental Distribution from SEM

    • SEM can visualize particle shape and elemental distribution.

    Compositional Contrast in SEM

    • Arises from the dependence of BSE escape ability on the atomic number of the specimen's atoms.

    Charging Effect in SEM

    • Surface charging occurs when examining electrically nonconductive surfaces.
    • Excessive electrons accumulate on the surface, leading to charged regions that deflect the electron probe.
    • Charging can be prevented by coating the specimen with a conductive film.

    Transmission Electron Microscopy (TEM)

    • Bragg's law applies to electron diffraction.

    • Diffraction angles are small (<1°) in TEM.

    • Diffracted beams from crystallographic planes form a diffraction pattern on the back-focal plane of the objective lens.

    • When the transmitted beam is parallel to a crystallographic axis, all the diffraction points from the same crystal zone will form a diffraction pattern (reciprocal lattice) on the back-focal plane.

      Diffraction Contrast in TEM

    • Differences in the scattering power of the specimen's atoms create contrast in the image.

    Phase Contrast in TEM

    • Phase contrast TEM (HRTEM) offers the highest resolution for lattice and structure images of crystalline materials.
    • At least two electron waves with different phases are required, such as the transmitted and diffracted beams.
    • Interference patterns from these beams create periodic dark-bright changes on the image plane.

    Phase Analysis by TEM

    • TEM helps analyze the phases (different crystal structures) present in a material and how they are arranged.

    Conclusion

    This summary provides a general overview of important concepts from the text on characterization techniques. The text offers insight into various techniques like X-ray, neutron, and electron diffraction, as well as scanning and transmission electron microscopy, focusing on their principles, applications, and underlying mechanisms.

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    Description

    This quiz explores the structural characteristics of spinel compounds, specifically focusing on their crystalline arrangements and cation distribution in Fe3O4. Additionally, it covers applications of X-ray Diffraction (XRD) in particle size analysis. Test your knowledge on these important concepts in material science and crystallography.

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