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Questions and Answers
What primarily contributes to surface topographic contrast in SEM?
What primarily contributes to surface topographic contrast in SEM?
Which electrical issue is commonly associated with examining nonconductive surfaces in SEM?
Which electrical issue is commonly associated with examining nonconductive surfaces in SEM?
What is the effect of using higher electron beam energy in SEM?
What is the effect of using higher electron beam energy in SEM?
What causes compositional contrast in SEM images?
What causes compositional contrast in SEM images?
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How can surface charging in SEM be effectively reduced?
How can surface charging in SEM be effectively reduced?
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What is the correct formula representation for normal spinel?
What is the correct formula representation for normal spinel?
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What is the Crystal Field Stabilization Energy (CFSE) of Fe2+ in the octahedral site?
What is the Crystal Field Stabilization Energy (CFSE) of Fe2+ in the octahedral site?
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Which of the following statements about Fe3+ cations is true?
Which of the following statements about Fe3+ cations is true?
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How does particle size affect the line broadening observed in XRD analysis?
How does particle size affect the line broadening observed in XRD analysis?
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What is the purpose of small angle X-ray scattering (SAXS) in XRD applications?
What is the purpose of small angle X-ray scattering (SAXS) in XRD applications?
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What is the significance of the diffraction angle (2θ) in a Transmission Electron Microscope (TEM)?
What is the significance of the diffraction angle (2θ) in a Transmission Electron Microscope (TEM)?
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Which beam combination is essential for generating phase contrast in TEM?
Which beam combination is essential for generating phase contrast in TEM?
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What outcome results from the recombination of transmitted and diffracted beams in TEM?
What outcome results from the recombination of transmitted and diffracted beams in TEM?
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How does the diffraction pattern form on the back-focal plane when the transmitted beam is parallel to a crystallographic axis?
How does the diffraction pattern form on the back-focal plane when the transmitted beam is parallel to a crystallographic axis?
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Why is phase contrast often referred to as high-resolution transmission electron microscopy (HRTEM)?
Why is phase contrast often referred to as high-resolution transmission electron microscopy (HRTEM)?
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What structure does MnO possess?
What structure does MnO possess?
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At what temperature does the magnetic ordering of Mn2+ ions in MnO break down?
At what temperature does the magnetic ordering of Mn2+ ions in MnO break down?
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What is the effective magnification of an SEM with a probe size of 10 nm?
What is the effective magnification of an SEM with a probe size of 10 nm?
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What additional information can SEM obtain using an X-ray energy-dispersive spectrometer (EDS)?
What additional information can SEM obtain using an X-ray energy-dispersive spectrometer (EDS)?
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What type of electrons are produced through elastic scattering in SEM?
What type of electrons are produced through elastic scattering in SEM?
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What percentage of energy do backscattered electrons typically retain from incident electrons?
What percentage of energy do backscattered electrons typically retain from incident electrons?
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What is one of the advantages of scanning electron microscopy (SEM) in terms of image depth of field?
What is one of the advantages of scanning electron microscopy (SEM) in terms of image depth of field?
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How is the magnification of SEM determined compared to transmission electron microscopy (TEM)?
How is the magnification of SEM determined compared to transmission electron microscopy (TEM)?
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Which equation relates the full width at half maximum (β) to the crystallite size (τ) and the diffraction angle (θ)?
Which equation relates the full width at half maximum (β) to the crystallite size (τ) and the diffraction angle (θ)?
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What is represented by the variable 'k' in the relation β = k ε (sin θ / cos θ)?
What is represented by the variable 'k' in the relation β = k ε (sin θ / cos θ)?
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How can the combined effects of crystallite size and microstrain on β be separated?
How can the combined effects of crystallite size and microstrain on β be separated?
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What does the differentiation of the equation nλ = 2d sin θ provide insight into?
What does the differentiation of the equation nλ = 2d sin θ provide insight into?
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What does the term β cos θ relate to in the context of XRD?
What does the term β cos θ relate to in the context of XRD?
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Which application involves assessing changes in the lattice parameter with temperature?
Which application involves assessing changes in the lattice parameter with temperature?
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What type of information can be determined about crystal structures using XRD with single crystals?
What type of information can be determined about crystal structures using XRD with single crystals?
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Which factor influences line broadening due to nonuniformity in the sample?
Which factor influences line broadening due to nonuniformity in the sample?
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Study Notes
Spinel Structure
- Eight MgAl2O4 formulas per unit cell
- Oxygen forms a face-centered cubic (fcc) lattice.
- Half of the octahedral sites are occupied by B ions in an alternating pattern.
- One-eighth of the tetrahedral sites are occupied by A ions.
- Normal spinel: (A)8a[B2]16dO4
- Inverse spinel: (B)8a[AB]16dO4
Fe3O4 Spinel
- Fe2+ (high spin): 3d6, t2g4eg2 (octahedral), e3t23 (tetrahedral)
- Octahedral site stabilization energy (OSSE) for Fe2+ is -1.33 Dqoct, making it more stable in octahedral sites than tetrahedral sites.
- Fe3+ (high spin): 3d5, t2g3eg2 (octahedral), e2t23 (tetrahedral)
- Fe3+ has no preference for octahedral or tetrahedral sites.
- Cation distribution in Fe3O4: (Fe3+)tet[Fe2+Fe3+]octO4, or (Fe3+)8a[Fe2+Fe3+]16dO4 (inverse)
- Magnetic measurements confirm the cation distribution.
Applications of X-ray Diffraction (XRD)
- Particle size analysis using XRD is effective for particles smaller than 200 nm.
- Line broadening increases as particle size decreases.
- Below 2-10 nm, lines become so broad that they disappear.
- Small-angle X-ray scattering (SAXS) measures inhomogeneities from 1-100 nm.
- Line broadening is influenced by instrumental factors (resolution of incident X-ray wavelength) and sample factors (crystallite size & microstrain).
Microstrain Determination
- Scherrer equation: = / cos
- Microstrain is related to line broadening through the equation: = - ( / 2) (cos / sin )
- Combined effect of crystallite size and microstrain: cos = k sin
- Plotting cos vs.sin separates crystallite size and strain effects.
Other Applications of XRD
- Determining thermal expansion coefficient through changes in lattice parameter with temperature.
- Assessing phase transitions at different temperatures.
- Determining crystal structure with single crystals, including atom positions, space groups, bond lengths, coordination numbers, and electron distribution.
Neutron Diffraction of MnO
- Neutrons have a magnetic dipole, leading to magnetic scattering.
- MnO adopts a sodium chloride structure with a Neel temperature of 120 K.
- At 80 K, Mn2+ ions undergo antiferromagnetic ordering, doubling the unit cell for neutron scattering but not for X-ray scattering.
- Magnetic ordering breaks down at 293 K due to thermal energy.
Scanning Electron Microscopy (SEM)
- Examines microscopic structure by scanning the surface.
- Offers high resolution and depth of field, providing a three-dimensional view.
- Magnification is determined by the ratio of display screen size to specimen area scanned.
- Provides magnifications from 20× to > 100,000×.
- Chemical information is obtained using an X-ray energy-dispersive spectrometer (EDS).
Signal Detection in SEM
- Elastic scattering produces backscattered electrons (BSEs) which are useful for elemental composition contrast.
- Inelastic scattering produces secondary electrons (SEs) which are used to create topographic contrast images.
- By varying the energy from 5 to 20 keV, surface features (low keV) or bulk information (high keV) can be obtained.
Topographic Contrast in SEM
- Variation in signal levels due to geometric features on the specimen surface.
- Edges emit more electrons than flat surfaces.
Particle Shape and Elemental Distribution from SEM
- SEM can visualize particle shape and elemental distribution.
Compositional Contrast in SEM
- Arises from the dependence of BSE escape ability on the atomic number of the specimen's atoms.
Charging Effect in SEM
- Surface charging occurs when examining electrically nonconductive surfaces.
- Excessive electrons accumulate on the surface, leading to charged regions that deflect the electron probe.
- Charging can be prevented by coating the specimen with a conductive film.
Transmission Electron Microscopy (TEM)
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Bragg's law applies to electron diffraction.
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Diffraction angles are small (<1°) in TEM.
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Diffracted beams from crystallographic planes form a diffraction pattern on the back-focal plane of the objective lens.
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When the transmitted beam is parallel to a crystallographic axis, all the diffraction points from the same crystal zone will form a diffraction pattern (reciprocal lattice) on the back-focal plane.
Diffraction Contrast in TEM
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Differences in the scattering power of the specimen's atoms create contrast in the image.
Phase Contrast in TEM
- Phase contrast TEM (HRTEM) offers the highest resolution for lattice and structure images of crystalline materials.
- At least two electron waves with different phases are required, such as the transmitted and diffracted beams.
- Interference patterns from these beams create periodic dark-bright changes on the image plane.
Phase Analysis by TEM
- TEM helps analyze the phases (different crystal structures) present in a material and how they are arranged.
Conclusion
This summary provides a general overview of important concepts from the text on characterization techniques. The text offers insight into various techniques like X-ray, neutron, and electron diffraction, as well as scanning and transmission electron microscopy, focusing on their principles, applications, and underlying mechanisms.
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Description
This quiz explores the structural characteristics of spinel compounds, specifically focusing on their crystalline arrangements and cation distribution in Fe3O4. Additionally, it covers applications of X-ray Diffraction (XRD) in particle size analysis. Test your knowledge on these important concepts in material science and crystallography.