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Questions and Answers
Which advantage of AFM allows it to operate in various environments?
Which advantage of AFM allows it to operate in various environments?
What is a significant disadvantage of AFM related to image acquisition?
What is a significant disadvantage of AFM related to image acquisition?
Which option describes a limitation of AFM regarding the samples it can analyze?
Which option describes a limitation of AFM regarding the samples it can analyze?
What might cause poor or unreliable images when using AFM?
What might cause poor or unreliable images when using AFM?
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What consideration must be taken into account to prevent image distortion in AFM?
What consideration must be taken into account to prevent image distortion in AFM?
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What physical property does a scanning tunneling microscope (STM) primarily measure to create images?
What physical property does a scanning tunneling microscope (STM) primarily measure to create images?
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Which component is responsible for precise positioning in a scanning probe microscope?
Which component is responsible for precise positioning in a scanning probe microscope?
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What does the term 'Fermi level' refer to in the context of STM?
What does the term 'Fermi level' refer to in the context of STM?
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How does the atomic force microscope (AFM) determine the force value during measurement?
How does the atomic force microscope (AFM) determine the force value during measurement?
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What role does the work function play in scanning tunneling microscopy?
What role does the work function play in scanning tunneling microscopy?
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Which interaction is primarily measured in both STM and AFM techniques?
Which interaction is primarily measured in both STM and AFM techniques?
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What happens when voltage is applied between the tip and the sample in an STM?
What happens when voltage is applied between the tip and the sample in an STM?
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Which of the following statements about scanning probe techniques is true?
Which of the following statements about scanning probe techniques is true?
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What is the relationship between the cantilever spring constant and the force causing it to bend according to Hooke's Law?
What is the relationship between the cantilever spring constant and the force causing it to bend according to Hooke's Law?
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What happens to the laser beam deflection when the interaction with the surface is stronger?
What happens to the laser beam deflection when the interaction with the surface is stronger?
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What is the average radius range of a typical AFM tip?
What is the average radius range of a typical AFM tip?
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How does the radius of the AFM tip affect the image obtained?
How does the radius of the AFM tip affect the image obtained?
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In contact mode of AFM, what is kept constant during imaging?
In contact mode of AFM, what is kept constant during imaging?
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What is a potential drawback of contact mode operation in AFM?
What is a potential drawback of contact mode operation in AFM?
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What characterizes the tapping mode of AFM?
What characterizes the tapping mode of AFM?
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What type of interaction shifts the cantilever resonant frequency lower in tapping mode?
What type of interaction shifts the cantilever resonant frequency lower in tapping mode?
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What is the main advantage of non-contact mode in AFM?
What is the main advantage of non-contact mode in AFM?
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How does Chemical Force Microscopy (CFM) differ from traditional AFM?
How does Chemical Force Microscopy (CFM) differ from traditional AFM?
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What is the resulting size of a convoluted feature given by the equation $L = 4(Rr)^{1/2}$?
What is the resulting size of a convoluted feature given by the equation $L = 4(Rr)^{1/2}$?
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What is a key disadvantage of using larger tip radii in AFM imaging?
What is a key disadvantage of using larger tip radii in AFM imaging?
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How is the piezo voltage used in AFM?
How is the piezo voltage used in AFM?
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What benefit does phase shift provide in tapping mode AFM?
What benefit does phase shift provide in tapping mode AFM?
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What is needed for electrons to flow between the tip and sample?
What is needed for electrons to flow between the tip and sample?
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What effect does a smaller gap distance have on tunneling current?
What effect does a smaller gap distance have on tunneling current?
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In scanning tunneling microscopy (STM), what happens as the tunneling current decays?
In scanning tunneling microscopy (STM), what happens as the tunneling current decays?
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What is the purpose of applying a bias voltage in the STM?
What is the purpose of applying a bias voltage in the STM?
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What does the feedback loop in STM primarily ensure?
What does the feedback loop in STM primarily ensure?
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Which component of the STM is key for maintaining the height of the tip?
Which component of the STM is key for maintaining the height of the tip?
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What enables electrons to tunnel across barriers in quantum mechanics?
What enables electrons to tunnel across barriers in quantum mechanics?
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In STM, which part of the conduction band do electrons come from?
In STM, which part of the conduction band do electrons come from?
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How does the atomic force microscope (AFM) measure the tip-sample interaction?
How does the atomic force microscope (AFM) measure the tip-sample interaction?
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What defines the atomic resolution capability in both STM and AFM?
What defines the atomic resolution capability in both STM and AFM?
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What must be ensured to maintain a constant tunneling current?
What must be ensured to maintain a constant tunneling current?
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Which of the following is a basic principle applicable to all scanning probe microscopy techniques?
Which of the following is a basic principle applicable to all scanning probe microscopy techniques?
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What is the role of the applied bias in relation to electron tunneling in STM?
What is the role of the applied bias in relation to electron tunneling in STM?
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Why is the atomic resolution in AFM considered significant?
Why is the atomic resolution in AFM considered significant?
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Study Notes
Scanning Probe Microscopy (SPM) Techniques
- SPMs image surfaces by measuring the interaction between a probe and the surface.
- The changing properties of the probe as it's scanned are measured to infer the nature of this interaction.
- This allows for image generation, similar to confocal or STED microscopy, line by line.
Scanning Tunneling Microscopy (STM)
- STM measures the electric current flowing between a probe tip and the sample surface.
- Electrons quantum tunnel between the tip and sample.
Key Components of STM
- Tip: Connected to a control unit/computer to measure and record current, and control tip position.
- Sample: A voltage (bias) is applied to induce current flow.
- Piezoelectric Actuators: Precisely position the tip or sample.
STM Operating Principle
- Fermi Level (EF): Highest occupied crystal orbital in a metal; equivalent to HOMO in molecules.
- Work Function (Φ): Energy needed to remove the least bound electron from a metal and place it outside the metal.
- Tip-Sample Interaction: Closing the tip and sample equalizes Fermi levels. Electrons tunnel across the vacuum barrier to create current flow.
- Applied Bias (Voltage): Shifting the relative Fermi levels of tip and sample with bias V, creating a current flow (electrons tunnel for energies above the tip's Fermi level).
- Tunneling Current: Controlled by gap distance; smaller gap increases overlap and tunneling probability, leading to a larger current that decays exponentially with increasing distance.
- STM Tip: Atomic-sized blob at the end, often ending in a single atom, enabling atomic resolution.
Feedback Loop in STM
- Ensures constant proximity to the sample (exponentially decaying current with distance).
- Constant Current Feedback Loop: Piezoelectric crystal adjusts tip height to maintain constant current when scanning.
- Topography (height map) is generated by piezo voltage variations across the position.
Imaging Molecular Orbitals with STM
- Tunneling electrons can originate from HOMO or LUMO (lowest unoccupied molecular orbital).
- Specific biases can image unique levels.
Atomic Force Microscopy (AFM)
- AFM uses a sharp tip on a cantilever to measure tip-sample interactions, causing cantilever deflection.
- Deflection is measured by reflecting a laser beam off the cantilever, converting it to a force value.
- Atomic resolution is possible.
AFM Operating Principle
- Cantilever Deflection: Sample-tip forces cause predictable cantilever bending, which is measured.
- Force Measurement: Hooke's Law (F = -kx) relates force to cantilever deflection. Attractive/repulsive interactions result in corresponding deflection variations.
AFM Tip
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Typically sharp (2-50nm radius) for accurate interaction with surface features.
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The tip radius can affect the image (convolution).
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Larger radii blur the image, and require careful calibration/deconvolution of results.
AFM Modes:
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Contact Mode: Constant cantilever deflection is maintained as the tip makes contact.
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Tapping Mode: Oscillating cantilever tip at resonant frequency intermittently contacts the surface, maintaining constant amplitude. (Superior for fragile samples)
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Non-Contact Mode: Oscillating cantilever tip maintains distance, minimizing sample damage and highlighting surface attractive interactions.
Chemical Force Microscopy (CFM)
- A modification of AFM where the tip is functionalized to study specific chemical interactions (beyond van der Waals).
- Imaging chemical properties and properties (contrast) of the sample.
Advantages of AFM
- Adaptable to diverse samples (e.g. conductive, non-conductive).
- Works in various environments.
- Non-destructive.
- Low cost, versatile and small (equipment-wise)
Disadvantages of AFM
- Slower imaging speed.
- Limited scan area and height range.
- Prone to tip damage and sample drift.
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Description
Explore the principles and key components of scanning probe microscopy, particularly focusing on scanning tunneling microscopy (STM). This quiz covers how STM operates, including the roles of the probe tip, sample, and piezoelectric actuators, as well as the underlying concepts such as Fermi level and work function.