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Questions and Answers
Why are many conventional methods for measuring resistivity unsatisfactory for semiconductors?
Why are many conventional methods for measuring resistivity unsatisfactory for semiconductors?
- They cannot measure the conductivity of semiconductor ingots or slices
- Metal-semiconductor contacts are usually rectifying in nature (correct)
- They inject excess concentration of minority carriers
- They do not permit measurements of resistivity in samples of various shapes
What is the primary advantage of the four probe method for measuring resistivity in semiconductors?
What is the primary advantage of the four probe method for measuring resistivity in semiconductors?
- It eliminates the injection of minority carriers by current carrying contacts
- It overcomes the rectifying nature of metal-semiconductor contacts (correct)
- It allows measurements of resistivity in samples of various shapes
- It accurately measures the conductivity of semiconductor ingots or slices
What does the four probe method allow measurements of, in samples of various shapes?
What does the four probe method allow measurements of, in samples of various shapes?
- Potential of other contacts
- Minority carrier injection
- Conductivity
- Resistivity (correct)
What is one of the difficulties that the four probe method overcomes in resistivity measurements?
What is one of the difficulties that the four probe method overcomes in resistivity measurements?
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What type of conductivity can the four probe method conveniently and accurately measure in semiconductor crystals?
What type of conductivity can the four probe method conveniently and accurately measure in semiconductor crystals?
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