7 Questions
True or false: Current retention failure profiling is reliable and fast?
False
True or false: The Reach profiler profiles at a longer refresh interval and higher temperature to identify potential cell failures?
True
True or false: REAPER enables a 16.3% system performance improvement and 36.4% DRAM power reduction?
True
True or false: Longer refresh intervals were previously unreasonable before the development of REAPER?
True
True or false: Data movement can cause high latency and high energy consumption?
True
True or false: Performing computation directly where the data resides is known as Processing in Memory (PIM)?
True
True or false: Near-data processing (NDP) is a general concept applicable to any data storage and movement unit?
True
Test your knowledge on DRAM refresh performance and energy overhead, as well as the challenges with current retention failure profiling. This quiz explores the goals of thoroughly analyzing profiling tradeoffs and developing a fast and reliable profiling mechanism. Learn about key contributions such as the detailed characterization of 368 LPDDR4 DRAM chips and the Reach profiler, which profiles at longer refresh intervals and higher temperatures for more accurate results.
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